5: Surface Analytical Techniques
- Page ID
- 25352
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\(\newcommand{\avec}{\mathbf a}\) \(\newcommand{\bvec}{\mathbf b}\) \(\newcommand{\cvec}{\mathbf c}\) \(\newcommand{\dvec}{\mathbf d}\) \(\newcommand{\dtil}{\widetilde{\mathbf d}}\) \(\newcommand{\evec}{\mathbf e}\) \(\newcommand{\fvec}{\mathbf f}\) \(\newcommand{\nvec}{\mathbf n}\) \(\newcommand{\pvec}{\mathbf p}\) \(\newcommand{\qvec}{\mathbf q}\) \(\newcommand{\svec}{\mathbf s}\) \(\newcommand{\tvec}{\mathbf t}\) \(\newcommand{\uvec}{\mathbf u}\) \(\newcommand{\vvec}{\mathbf v}\) \(\newcommand{\wvec}{\mathbf w}\) \(\newcommand{\xvec}{\mathbf x}\) \(\newcommand{\yvec}{\mathbf y}\) \(\newcommand{\zvec}{\mathbf z}\) \(\newcommand{\rvec}{\mathbf r}\) \(\newcommand{\mvec}{\mathbf m}\) \(\newcommand{\zerovec}{\mathbf 0}\) \(\newcommand{\onevec}{\mathbf 1}\) \(\newcommand{\real}{\mathbb R}\) \(\newcommand{\twovec}[2]{\left[\begin{array}{r}#1 \\ #2 \end{array}\right]}\) \(\newcommand{\ctwovec}[2]{\left[\begin{array}{c}#1 \\ #2 \end{array}\right]}\) \(\newcommand{\threevec}[3]{\left[\begin{array}{r}#1 \\ #2 \\ #3 \end{array}\right]}\) \(\newcommand{\cthreevec}[3]{\left[\begin{array}{c}#1 \\ #2 \\ #3 \end{array}\right]}\) \(\newcommand{\fourvec}[4]{\left[\begin{array}{r}#1 \\ #2 \\ #3 \\ #4 \end{array}\right]}\) \(\newcommand{\cfourvec}[4]{\left[\begin{array}{c}#1 \\ #2 \\ #3 \\ #4 \end{array}\right]}\) \(\newcommand{\fivevec}[5]{\left[\begin{array}{r}#1 \\ #2 \\ #3 \\ #4 \\ #5 \\ \end{array}\right]}\) \(\newcommand{\cfivevec}[5]{\left[\begin{array}{c}#1 \\ #2 \\ #3 \\ #4 \\ #5 \\ \end{array}\right]}\) \(\newcommand{\mattwo}[4]{\left[\begin{array}{rr}#1 \amp #2 \\ #3 \amp #4 \\ \end{array}\right]}\) \(\newcommand{\laspan}[1]{\text{Span}\{#1\}}\) \(\newcommand{\bcal}{\cal B}\) \(\newcommand{\ccal}{\cal C}\) \(\newcommand{\scal}{\cal S}\) \(\newcommand{\wcal}{\cal W}\) \(\newcommand{\ecal}{\cal E}\) \(\newcommand{\coords}[2]{\left\{#1\right\}_{#2}}\) \(\newcommand{\gray}[1]{\color{gray}{#1}}\) \(\newcommand{\lgray}[1]{\color{lightgray}{#1}}\) \(\newcommand{\rank}{\operatorname{rank}}\) \(\newcommand{\row}{\text{Row}}\) \(\newcommand{\col}{\text{Col}}\) \(\renewcommand{\row}{\text{Row}}\) \(\newcommand{\nul}{\text{Nul}}\) \(\newcommand{\var}{\text{Var}}\) \(\newcommand{\corr}{\text{corr}}\) \(\newcommand{\len}[1]{\left|#1\right|}\) \(\newcommand{\bbar}{\overline{\bvec}}\) \(\newcommand{\bhat}{\widehat{\bvec}}\) \(\newcommand{\bperp}{\bvec^\perp}\) \(\newcommand{\xhat}{\widehat{\xvec}}\) \(\newcommand{\vhat}{\widehat{\vvec}}\) \(\newcommand{\uhat}{\widehat{\uvec}}\) \(\newcommand{\what}{\widehat{\wvec}}\) \(\newcommand{\Sighat}{\widehat{\Sigma}}\) \(\newcommand{\lt}{<}\) \(\newcommand{\gt}{>}\) \(\newcommand{\amp}{&}\) \(\definecolor{fillinmathshade}{gray}{0.9}\)- 5.1: Surface Sensitivity and Surface Specificity
- This page covers the sensitivity and specificity challenges in surface spectroscopy techniques like X-ray Photoelectron Spectroscopy (XPS). It emphasizes the importance of distinguishing surface from bulk signals, particularly through the concept of the Inelastic Mean Free Path (IMFP) of electrons. Most detected electrons come from within one to three IMFPs from the surface, making understanding IMFP critical for enhancing surface sensitivity and estimating surface film thickness.
- 5.2: Auger Electron Spectroscopy
- This page explains Auger Electron Spectroscopy (AES), a technique for analyzing surface composition by detecting emitted low-energy electrons post-atomic ionization. The process includes ionization, Auger electron emission, and analysis. AES is adept at elemental detection, even at 1% monolayer sensitivity, and allows for depth profiling and spatial analysis of samples.
- 5.3: Photoelectron Spectroscopy
- This page covers photoelectron spectroscopy (PES) as a method for analyzing surface composition and electronic states, detailing X-ray and ultraviolet variants (XPS and UPS). It emphasizes the significance of photon energy absorption, binding energy, and experimental setups, including electron energy analyzers.
- 5.4: Vibrational Spectroscopy
- This page covers the importance of vibrational spectroscopy in identifying surface species through techniques like IR Spectroscopy and Electron Energy Loss Spectroscopy (EELS). It explains various IR methods and their sensitivities, as well as EELS's surface specificity and limitations. The text particularly highlights CO adsorption on metallic surfaces and how vibrational frequencies relate to bonding interactions.
- 5.5: Secondary Ion Mass Spectrometry
- This page discusses Secondary Ion Mass Spectrometry (SIMS), a highly sensitive technique for detecting impurity elements at low concentrations. It describes the common process of ion bombardment which ejects particles from the sample surface. Various mass analyzers are mentioned, with Time-of-Flight (TOF) analyzers favored for their sensitivity.
- 5.6: Temperature-Programmed Techniques
- This page covers techniques for studying surface reactions and molecular adsorption, focusing on Temperature Programmed Desorption (TPD) and Temperature Programmed Reaction Spectroscopy (TPRS). TPD is effective for single crystal studies and employs mass spectrometry to analyze desorption patterns, with key insights on peak areas, adsorption enthalpy, and varied desorption peaks due to multiple binding states.