21: Surface Characterization by Spectroscopy and Microscopy
- Page ID
- 333374
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- 21.1: Introduction to the Study of Surfaces
- Thus far we have considered methods for analyzing the bulk properties of samples, such as determining the identity or concentration of an ion in a solution, of a molecule in a gas, or of several elements in a solid. In do so, we did not concern ourselves with the sample's homogeneity or heterogeneity, which may vary along any of the x,y,z-axes. In this chapter we give consideration to the composition of a sample's surface.
- 21.2: Spectroscopic Surface Methods
- n this section we consider three representative surface analytical methods: X-ray photoelectron spectroscopy, in which the input is a beam of X-ray photons and the output is electrons; Auger electron spectroscopy, in which the input is either a beam of electrons or of X-ray photons and the output is electrons; and secondary-ion mass spectrometry, in which the input is a beam of ions and the output is ions.
- 21.3: Scanning Electron Microscopy
- In scanning electron microscopy we raster a beam of high-energy electrons over a surface using a two-dimensional grid, achieving a resolution limit of approximately 0.2 nm, or approximately 1000× better than an optical microscope.
- 21.4: Scanning Probe Microscopes
- in the last section we considered how we can image a surface using an electron beam. In this section we consider a very different approach to developing an image of a surface, one in which we bring a probe close to the surface and examine how the probe interacts with the surface. One advantage of this approach is that the interaction between the probe and the surface can include attraction and repulsion, which opens up vertical movement as a third dimension to the image.