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9: Surface Morphology and Structure

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    • 9.1: Interferometry
      The processes which occur at the surfaces of crystals depend on many external and internal factors such as crystal structure and composition, conditions of a medium where the crystal surface exists and others. The appearance of a crystal surface is the result of complexity of interactions between the crystal surface and the environment.
    • 9.2: Atomic Force Microscopy (AFM)
      Atomic force microscopy (AFM) is a high-resolution form of scanning probe microscopy, also known as scanning force microscopy (SFM).
    • 9.3: SEM and its Applications for Polymer Science
      The scanning electron microscope (SEM) is a very useful imaging technique that utilized a beam of electrons to acquire high magnification images of specimens. Very similar to the transmission electron microscope (TEM), the SEM maps the reflected electrons and allows imaging of thick (~mm) samples, whereas the TEM requires extremely thin specimens for imaging; however, the SEM has lower magnifications.
    • 9.4: Catalyst Characterization Using Thermal Conductivity Detector
      Metal dispersion is a commong term within the catalyst industry. The term refers to the amount of metal that is active for a specific reaction. Let’s assume a catalyst material has a composition of 1 wt% palladium and 99% alumina (Al2O3) (Figure 9.4.1 ) Even though the catalyst material has 1 wt% of palladium, not all the palladium is active.
    • 9.5: Nanoparticle Deposition Studies Using a Quartz Crystal Microbalance

    This page titled 9: Surface Morphology and Structure is shared under a CC BY 4.0 license and was authored, remixed, and/or curated by Pavan M. V. Raja & Andrew R. Barron (OpenStax CNX) via source content that was edited to the style and standards of the LibreTexts platform; a detailed edit history is available upon request.