Additional SPM Methods
- Page ID
- 278618
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- Lateral Force Microscopy
- Lateral Force Microscopy (LFM) is conducted when imaging in the contact mode. During scanning in contact mode the cantilever bends not only along vertically to the surface as a result of repulsive Van der Waals interactions, but the cantilever also undergoes torsional (lateral) deformation. LFM measures the torsional bending (or twisting) of the cantilever, which is dependent on a frictional force acting on tip. As a result, this method is also known as friction force microscopy (FFM).