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Additional SPM Methods

  • Page ID
    278618
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    • Lateral Force Microscopy
      Lateral Force Microscopy (LFM) is conducted when imaging in the contact mode. During scanning in contact mode the cantilever bends not only along vertically to the surface as a result of repulsive Van der Waals interactions, but the cantilever also undergoes torsional (lateral) deformation. LFM measures the torsional bending (or twisting) of the cantilever, which is dependent on a frictional force acting on tip. As a result, this method is also known as friction force microscopy (FFM).
    • Chemical Force Microscopy
    • Magnetic Force Microscopy
    • Phase Imaging


    This page titled Additional SPM Methods is shared under a CC BY-NC-SA 2.5 license and was authored, remixed, and/or curated by Heather A. Bullen & Robert A. Wilson via source content that was edited to the style and standards of the LibreTexts platform; a detailed edit history is available upon request.