Goals and Objectives
- Page ID
- 278422
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Goals
The basic theory and applications of scanning probe microscopy (SPM) will be presented. Emphasis will be placed on SPM characterization methods including:
- scanning tunneling microscopy
- atomic force microscopy
- lateral force microscopy
- chemical force microscopy
- magnetic force microscopy
- phase imaging
Objectives
Upon completion of this module you understand the basic principles, operation and applications of SPM.