Table of Contents
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Table of Contents
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Licensing
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About the Author
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1: Introduction
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2: Electrical Components and Circuits
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3: Operational Amplifiers
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4: Analog and Digital Data
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5: Signals and Noise
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6: An Introduction to Spectrophotometric Methods
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7: Components of Optical Instruments
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8: An Introduction to Optical Atomic Spectroscopy
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9: Atomic Absorption Spectrometry
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10: Atomic Emission Spectrometry
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11: Atomic Mass Spectrometry
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12: Atomic X-Ray Spectrometry
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13: Introduction to Ultraviolet/Visible Absorption Spectrometry
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14: Applications of Ultraviolet/Visible Molecular Absorption Spectrometry
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15: Molecular Luminescence
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16: An Introduction to Infrared Spectrometry
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17: Applications of Infrared Spectrometry
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18: Raman Spectroscopy
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19: Nuclear Magnetic Resonance Spectroscopy
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20: Molecular Mass Spectrometry
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21: Surface Characterization by Spectroscopy and Microscopy
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22: An Introduction to Electroanalytical Chemistry
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23: Potentiometry
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24: Coulometry
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25: Voltammetry
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26: Introduction to Chromatographic Separations
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27: Gas Chromatography
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28: High-Performance Liquid Chromatography
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29: Supercritical Fluid Chromatography
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30: Capillary Electrophoresis and Capillary Electrochromatography
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31: Thermal Methods
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32: Radiochemical Methods
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33: Automated Methods of Analysis
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34: Particle Size Determination
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35: Appendicies
- 35.1: Evaluation of Analytical Data
- 35.2: Single-Sided Normal Distribution
- 35.3: Critical Values for t-Test
- 35.4: Critical Values for F-Test
- 35.5: Critical Values for Dixon's Q-Test
- 35.6: Critical Values for Grubb's Test
- 35.7: Activity Coefficients
- 35.8: Standard Reduction Potentials & Polarographic Half-wave Potentials
- 35.9: Recommended Primary Standards
- 35.10: Acronyms and Abbreviations
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Index
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Detailed Licensing