This module provides an introduction to Scanning Probe Microscopy (SPM). SPM is a family of microscopy techniques where a sharp probe (2-10 nm) is scanned across a surface and probe-sample interactions are monitored.
SPM is an extremely useful tool that is utilized in numerous research settings ranging from chemistry and materials to biological sciences. In addition to imaging surfaces with nanometer resolution, SPM can also be used to determine a variety of properties including: surface roughness, friction, surface forces, binding energies, and local elasticity.
This module is aimed at presenting the basic theory and applications of SPM. It is aimed towards undergraduates and anyone who wants an introduction into SPM. There are two primary forms of SPM: Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). The basic theory of both of these techniques is presented here along with an introduction into some additional SPM characterization methods.
Contributors and Attributions
- Dr. Heather A. Bullen (University of Northern Kentucky): email@example.com
- Robert A. Wilson (University of Northern Kentucky)
- This work is partially supported through NSF grant DMR-0526686. The authors would also like to acknowledge the participants at the ASDL Curriculum Development Workshop held at the University of California - Riverside, July 10-14, 2006.
- This work is licensed under a Creative Commons Attribution-Noncommercial-Share Alike 2.5 License and contains web-linked material.
- Content from ASDL.