12: Atomic X-Ray Spectrometry
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X-ray spectroscopy is a gathering name for several spectroscopic techniques for characterization of materials by using x-ray excitation. Atoms can be excited by a high-energy beam of charged particles such as electrons (in an electron microscope for example), protons (see PIXE) or a beam of X-rays (see X-ray fluorescence, or XRF). These methods enable elements from the entire periodic table to be analysed, with the exception of H, He and Li. In electron microscopy an electron beam excites X-rays; there are two main techniques for analysis of spectra of characteristic X-ray radiation: energy-dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS).
Thumbnail: Physics of X-ray fluorescence in a schematic representation. Image used with permission (Public Domain; Calvero).